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Welcome!

The infrared microscopy beamline analyses a diverse range of samples for chemical and structural information; from bone to meteorites to electrochemical cells to plant material to cheese to paint, the possibilities seem almost endless!

There are predominantly two reasons to utilise synchrotron-FTIR microscopy:

1. To gain spatially resolved information about a sample through raster mapping (point-by-point measurements of individual spectra that are stitched together)

2. To acquire single point spectra on samples which are too small for laboratory-based instruments

We love our beamline, and we think you will too! Here are the people to contact if you want to chat about potential projects using the IRM instrument.

Ready to write a proposal? Find below some of the commonly requested information.

Technical Information

• Techniques available

• Hardware and software available at the Beamline

• Routine Beamline performance checks

• Light path - front end to microscope

• Publications from the IRM Beamline

Proposal Preparation

• Writing your proposal

  • General advice and FAQs

• How small is too small?

  • Available "beam size" for sample measurements

  • Diffraction limited resolution (theoretical)

  • Spatial resolution achieved experimentally at the beamline in transmission and “hybrid” macro-ATR modes

• Hardware-based wavenumber limits

  • Window material limits

  • Detector wavenumber cut-offs and detectivities

• How much time do I need to apply for?

  • Data acquisition times based on number of co-added scans

  • "Hybrid" macro-ATR: estimating acquisition time

  • Map Time Calculator

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A general introduction to IRM