High Throughput NEXAFS System

Owned by AS Spectroscopy (Unlicensed)
Last updated: Sept 01, 2022

An inline high throughput NEXAFS chamber has been constructed upstream on the Imaging branchline. This chamber allows for batching of multiple samples for automatic scanning. The system is built for samples that are not compatible with ultra-high vacuum (samples can be scanned at a pressure of 10-6 mbar) and is ideal for beam sensitive samples.

Detectors

  • Hemispherical Analyser (Auger Electron Yield mode)

  • Retarding Grid Analysers (Partial Electron Yield and Fluoresence Yield modes)

  • Drain Current

  • Photodiode

Sample Environment

High Vacuum (HV) environment, base pressure 1 × 10-7 mbar. Room temperature samples only

Preparation facilities

  • Flood gun

  • Sample transfer carousel

  • Easy sample loading

  • Batch scanning

Click here for information on safe transport and handling of samples.

Data analysis
Data formats

  • NEXAFS data from beamline software: *.mda, ASCII

Analysis software

  • QANT