Techniques XFM
- Microscopy Cluster (Unlicensed)
- AS Microscopy Wiki
XFM performs many techniques. See our XFM Beamline paper for more details.
2D mapping
XANES imaging
line XANES
ptychography (see ptychography overview poster below)
XRF tomography
Large object scanning, e.g., artwork with the milliprobe
tandem probe mode (special case). Our 'tandem probe analysis mode' scanning technique, using the milliprobe and microprobe simultaneously, was not described in the XFM beamline paper, but is published in the journal Analytical Chemistry: https://pubs.acs.org/doi/full/10.1021/acs.analchem.1c04255
The so-called dual mode technique uses the milliprobe and microprobe to scan different samples simultaneously. Generally larger, highly transmissive (T>95%) samples can be placed in the milliprobe and scanned at >100 micron resolution. The transmitted beam is then used for the microprobe for scanning at 2 micron resolution.
The layout of the XFM beamline experimental endstation.
A = quad diode BPM, B = SSA slits, C = milliprobe (with large object installed), D = removable helium flight tube, E = clean-up slits and ion chamber (not shown for clarity), F = KB mirror enclosure, G = Maia detector, H = SDD detector and I = Eiger detector.
For dual mode scanning, samples are placed at locations C and G.