User Software and Resources
The SXR beamline previously provided users with a USB drive containing the materials listed below. Since January 2026, all contents have been moved to this link, so please feel free to watch and download the videos and other resources as needed.
Download SXR Fast Batch Scanning Software⬇️💻
The Soft X-ray Batch Scanning software is a tool used at the beamline to automate the collection of multiple X-ray absorption scans in a sequence. Instead of running each scan manually, the software lets users create a batch (a list of scans), and the system performs them one after another.
Download the most recent version (v1.3.1), available since January 2026:
💾⬇️Please download:
Installation instructions:
This video is a walkthrough of the batch scan software for SXR users at the Australian Synchrotron.
Download QANT Software⬇️💻
The program was developed for the soft X-ray beamline of the Australian Synchrotron to streamline workflow in near-edge X-ray absorption fine‑structure (NEXAFS) spectroscopy.
[journals.iucr.org]
QANT allows users to:
Immediately load and view corrected spectra
Apply background subtraction
Normalize spectra to a standard or apply “double normalization” when the standard itself has unwanted spectral features.
In 2025, we transitioned from the VME detector architecture to the Detaq system. We are working through these changes to determine how to integrate them into the GitHub repository. Please download the compatible QANT software (until further notice).
The latest version is available below:
💾⬇️Please download:
Important note: Please install this version over ANY existing installation.
Manuals and sample mounting 📖🧪:
This document provides a step‑by‑step procedure for properly mounting powder samples onto the Sample Ruler used in the Fast NEXAFS system at the Australian Synchrotron. The goal is to ensure clean, uniform, and secure sample preparation for reliable NEXAFS measurements.
💾⬇️Please download:
Useful Reference Documents 📄📌
Feel free to read these useful documents, as they will help you understand the basics of NEXAFS and how the synchrotron helps you collect NEXAFS data.
➡️ Information on the Channeltron PEY detector 🧪📊
🌟 Why do we use the channeltron PEY detector?
✔️ Surface sensitivity — great for studying thin films, coatings, surface chemistry, corrosion, catalysts, etc.
✔️ Selectivity — filters out lower-energy electrons and background noise, improving data clarity.
✔️ Non-destructive — no need to damage or modify the sample
Pictures of the Channeltron Detector:
Photon_calibrations_Fast_Nexafs(Collected on Sept 2020) 💡📐
When we provide your NEXAFS data, it is helpful to understand photon calibration. Calibration makes sure the X-ray energies are correct, so the absorption features you see truly reflect your sample. Without it, spectra can appear shifted, which can lead to misinterpretation. Knowing how calibration works helps you analyse the data confidently and ensures your results are accurate and reliable.
Photon calibrations measured at the SXR beamline: